Swift heavy ion tracks in nanocrystalline TiO2
Ibrayeva A. OConnell J. Mutali A. Skuratov V. Li J.
March 2025Elsevier Ltd
Vacuum
2025#233
The article presents results of the transmission electron microscopy examination of nanocrystalline TiO2 irradiated with swift Kr, Xe and Bi ions in a wide electron energy loss range. Threshold energy loss for a formation of amorphous tracks were estimated between 9.5 ± 1.5 and 11.5 ± 0.5 keV/nm. At Se lower than 5.2 ± 0.9 keV/nm no tracks were detected. Comparative analysis of tracks in nanocrystalline and bulk TiO2 suggests that there is an insignificant influence of grain size on their structural stability during ion irradiation.
Nanocrystals , Threshold energy loss , Tracks , Transmission electron microscopy
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Institute of Nuclear Physics, 1 Ibragimov St., Almaty, 050032, Kazakhstan
KIMEP University, 2 Abai Ave., Almaty, 050010, Kazakhstan
Center for HRTEM, Nelson Mandela University, Building 124, Summerstrand, Port Elizabeth, 6031, South Africa
Flerov Laboratory of Nuclear Reactions, Joint Institute for Nuclear Research, 6 Joliot-Curie St., Moscow Region, Dubna, 141980, Russian Federation
L.N. Gumilyov Eurasian National University, 2 Satpayev St., Astana, 010008, Kazakhstan
National Research Nuclear University MEPhI, 9/15 8th Parkovaya St., Moscow, 105043, Russian Federation
Dubna State University, 24 Zhukov St., Dubna, 140090, Russian Federation
Jiangsu University of Science and Technology, 2 Mengxi Rd, Jingkou District, Zhenjiang, 212100, China
Institute of Nuclear Physics
KIMEP University
Center for HRTEM
Flerov Laboratory of Nuclear Reactions
L.N. Gumilyov Eurasian National University
National Research Nuclear University MEPhI
Dubna State University
Jiangsu University of Science and Technology
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