Boron induced x-ray production cross sections
Gorlachev I. Ivanov I. Kharkin P. Kireyev A. Koloberdin M. Platov A. Zdorovets M. Burtebayev N.
October 2025Elsevier B.V.
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
2025#567
The production cross sections of K-, L-, and M−shell x-rays induced by accelerated boron ions were measured at energies ranging from 11.0 to 17.6 MeV in 2.2 MeV increments. Thin films of Al, Ti, Cr, Cu, Zn, Zr, Nb, Mo, Ag, Cd, In, Sn, Sb, Ta, W, Pb, and Bi, deposited on Mylar substrates via ion-plasma sputtering, were used as targets. X-ray production cross sections were determined using Rutherford backscattering cross sections. To enable this calculation, backscattered ions were detected simultaneously with the emitted x-rays. The experimental results were compared with theoretical predictions based on the ECPSSR and PWBA models, as implemented in the ISICS-11 code.
Boron ions , ECPSSR model , PIXE , PWBA model , Rutherford backscattering , X-ray production cross section
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Institute of Nuclear Physics, 050032, Ibragimov 1, Almaty, Kazakhstan
L.N. Gumilyov, Eurasian National University, Mirzoyan 2, Astana, Kazakhstan
Institute of Nuclear Physics
L.N. Gumilyov
10 лет помогаем публиковать статьи Международный издатель
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