A Low Temperature Cell for High Frequency Electrophysical Measurements of Semiconductor Devices
Aimaganbetov K.P. Aldiyarov A.U. Zhantuarov S.R. Almasov N.Z. Terukov E.I. Tokmoldin N.S.
November 2021Pleiades journals
Instruments and Experimental Techniques
2021#64Issue 6886 - 890 pp.
Abstract: A description of an experimental measuring cell designed to study the electrophysical characteristics of semiconductor elements at low temperatures is given. In contrast to traditional two-contact devices of this type, the developed experimental cell has three measuring contacts, which make it possible to carry out electrophysical measurements of flat and volumetric samples. The working temperature range of the cell is 16 K or higher. The impedance characteristics of heterojunction silicon and perovskite solar cells were measured in the frequency ranges from 100 Hz to 5 MHz and temperatures of 120–300 K. The measurement results are in satisfactory agreement with the literature data.
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Satbayev University, Institute of Physics and Technology, Almaty, Kazakhstan
Kazakh National University, Almaty, Kazakhstan
Nazarbayev University, Nur-Sultan, Kazakhstan
Scientific and Technical Center for Thin-Film Technologies in Power Engineering, Ioffe Physical–Technical Institute, St. Petersburg, 194021, Russian Federation
Universität Potsdam, Potsdam, Germany
Satbayev University
Kazakh National University
Nazarbayev University
Scientific and Technical Center for Thin-Film Technologies in Power Engineering
Universität Potsdam
10 лет помогаем публиковать статьи Международный издатель
Книга Публикация научной статьи Волощук 2026 Book Publication of a scientific article 2026